Defects are always a critical aspect in wafer manufacturing. When it comes to manual defect detection process it’s always a tough story - difficult, time consuming, expensive and may cause a huge loss ratio to the industry. Precise accuracy achieved by a human inspection is often not sufficient and least accurate.
Automatic or automated optical inspection (AOI) is a technique used in machines, where the products are examined by scanning their surfaces. This technique is widely used in finding defects in manufacturing of electronic item particularly in printed circuit board (PCB). AOI helps in fast and accurate inspection of electronic assemblies to make sure the quality and items are built correctly and having no faults behind.
Optical inspection can be automated using a machine for better results and high productivity. Automatic visual inspections machines are fitted with a camera than autonomously scan over the product for defects. It is a non-contact testing method for quality. The camera is positioned in the center over the product, and it is easy to move in a plane vertically to the board. As it moves …show more content…
Both are programs (’daemons’) that run in the background, and which provide functions that are necessary for ToolControl® to operate properly. The icons can be found in the system tray on the lower part of the screen, where all the other small program icons and the system clock are displayed. One has to login before initializing the tool. After a successful initialization, the tool goes to operation mode Auto 1. All stations inside the tool are equipped with wafer presence sensors. If wafers are detected after initialization, a Clear System procedure is executed. The tool will report that active materials have been found in the